902-470 Test Set Semiconduc with NSN 6625001795844 by Joint Electronics Type Designation System

Part Number: 902-470

Alternate P/N: 902470

Manufacturer: Joint Electronics Type Designation System

NSN: 6625-00-179-5844

NIIN: 001795844

Item Name : Test Set Semiconduc

CAGE Code: 80058

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country: USA

NCB Code: 00

At Orbit NSN, we offer an expansive inventory of Test Set Semiconduc components by Joint Electronics Type Designation System, including part number 902-470, and many others. On this page, you can complete and submit a quote request form for this part number and others with the NSN 6625001795844 to receive a customized solution within 15 minutes or less of submission. All we ask is that you include relevant information while filling out this form, such as your desired part quantity and budget parameters, so our dedicated staff can best respond with a quote that suits your needs and restrictions alike.

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Quality is the cornerstone of our operations at Orbit NSN, and as such, we proudly operate with AS9120B, ISO 9001:2015, and FAA AC 00-56B accreditation, in addition to adhering to a strict NO CHINA SOURCING policy. To make your search simple, our catalogs feature items with CAGE Code 80058 and FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments so that you always know you are procuring the exact items you need. To learn more about components with the NSN 6625-00-179-5844, such as this part manufactured by Joint Electronics Type Designation System, give us a call or email at any time, and a dedicated team member will be more than happy to assist you however they can through the procurement process. Get started today to see why our customers continue to rely on our top-notch products and services for all their operational needs.

Characteristics Data of NSN 6625-00-179-5844, 6625001795844

MRC	Criteria	Characteristic
AFHS	ACCESSORY COMPONENT QUANTITY	1 AND 1 AND 1 AND 1
ACYN	AC VOLTAGE RATING	115.0 VOLTS NOMINAL
FAAZ	PHASE	SINGLE
AQXY	TEST TYPE FOR WHICH DESIGNED	TRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS
ANPZ	INCLOSURE FEATURE	SINGLE ITEM W/CARRYING CASE
ACYR	DC VOLTAGE RATING	2.0 VOLTS MINIMUM AND 9.0 VOLTS MAXIMUM
AKWB	JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER	TYPE NO. AN/USM-206A
ABRY	LENGTH	9.000 INCHES NOMINAL
ANNQ	MATERIAL AND LOCATION	PLASTIC CARRYING CASE
AKWA	JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME	TEST,SEMICONDUCTOR DEVICE
AQXZ	OPERATING TEST CAPABILITY	METER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST
AKVY	ACCESSORY CONTROLLING AGENCY	JETDS AND JETDS AND JETDS AND JETDS
AKVZ	ACCESSORY IDENTIFYING NUMBER	TS-2798/USM-206A TYPE NO. AND CW-1049/USM-206A TYPE NO. AND CX-11898/USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO.
ALSF	INTERNAL BATTERY ACCOMMODATION	INCLUDED
HGTH	HEIGHT	10.000 INCHES NOMINAL
AEAS	MAJOR COMPONENTS	TEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST
ACZB	FREQUENCY RATING	50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM
ABGL	WIDTH	8.000 INCHES NOMINAL