4925A Test Set Data Trans with NSN 6625012222547 by Keysight Technologies Inc

Part Number: 4925A

Manufacturer: Keysight Technologies Inc

NSN: 6625-01-222-2547

NIIN: 012222547

Item Name : Test Set Data Trans

CAGE Code: 1LQK8

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country: USA

NCB Code: 01

At Orbit NSN, we offer an expansive inventory of Test Set Data Trans components by Keysight Technologies Inc, including part number 4925A, and many others. On this page, you can complete and submit a quote request form for this part number and others with the NSN 6625012222547 to receive a customized solution within 15 minutes or less of submission. All we ask is that you include relevant information while filling out this form, such as your desired part quantity and budget parameters, so our dedicated staff can best respond with a quote that suits your needs and restrictions alike.

Note : We Will Not Share Your Information To Any Third Parties.

Product Details

“*” Required Fields Are Compulsory

Contact Information

* By clicking this box, I acknowledge that I have read and accept the ASAP Semiconductor Terms and Conditions and agree that all quotes and purchase orders are exclusively subject to the ASAP Semiconductor Terms and Conditions.

I consent to receive email communications from ASAP Semiconductor and can unsubscribe at any time.
ASAP Semiconductor is a wholly independent aftermarket parts distributor.
This website is intended for quotations based on part numbers only. Please DO NOT submit drawings, technical data, or other specifications through this portal.

Disclaimer: This is a quotation for the goods listed above. This quotation is meant as an estimate and does not reflect a final bill or invoice. All quotations are subject to change until acceptance by ASAP Semiconductor of a binding Purchase Order, and quotations may be withdrawn or revised at the sole discretion of ASAP Semiconductor. This quotation is subject to the ASAP Semiconductor Terms & Conditions available at https://www.asapsemi.com/customer-terms-and-conditions/ . All United States Government and Department of Defense bids are quoted as CAGE code 6RE77 from ASAP Semiconductor’s Anaheim, California facility. Any quotation from ASAP Semiconductor without 6RE77 is void.

Upload RFQ SHEET

If you have more than one item, upload your spreadsheet here

Upload File

Quality is the cornerstone of our operations at Orbit NSN, and as such, we proudly operate with AS9120B, ISO 9001:2015, and FAA AC 00-56B accreditation, in addition to adhering to a strict NO CHINA SOURCING policy. To make your search simple, our catalogs feature items with CAGE Code 1LQK8 and FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments so that you always know you are procuring the exact items you need. To learn more about components with the NSN 6625-01-222-2547, such as this part manufactured by Keysight Technologies Inc, give us a call or email at any time, and a dedicated team member will be more than happy to assist you however they can through the procurement process. Get started today to see why our customers continue to rely on our top-notch products and services for all their operational needs.

Characteristics Data of NSN 6625-01-222-2547, 6625012222547

MRC	Criteria	Characteristic
SR-5	THE MANUFACTURERS DATA
SR-5	DESIGN CONTROL REFERENCE	4925A
ACYR	DC VOLTAGE RATING	9.0 VOLTS NOMINAL
RDAL	III REFERENCE DATA AND LITERATURE	HP 85 DATA CATALOG
AGAV	III END ITEM IDENTIFICATION	HP DATA COMMUNICATIONS TEST EQUIPMENT, P/N 37100S
SR-5	MANUFACTURERS CODE	1LQK8
AQXY	TEST TYPE FOR WHICH DESIGNED	BIT ERROR RATE
ANPZ	INCLOSURE FEATURE	SINGLE ITEM W/HOUSING
AKWC	ELECTRICAL POWER SOURCE RELATIONSHIP	SELF-CONTAINED
FTLD	III FUNCTIONAL DESCRIPTION	PERFORMS STANDARD BIT AND BLOCK ERROR TESTS AND MEASURES ERRORED SECONDS, PERCENT ERROR FREE SECONDS, TIMING DELAY AND PARITY ERRORS
AQXZ	OPERATING TEST CAPABILITY	FAULT ISOLATION AND BIT ERROR
ALSF	INTERNAL BATTERY ACCOMMODATION	INCLUDED
FEAT	SPECIAL FEATURES	FRAME DATA FOR TESTING CHARACTER ORIENTED SYSTEMS ABILITY; START-UP TESTS: ENE-TO-END HALF DUPLEX PING-PONG TEST, LOCAL MODEM LOOPBACK TEST, TEST FOR USAGE OF REMOTE TESTING CAPABILITY OF THE BELL 208B MODEM; MANIPULATES/MONITORS INDIVIDUAL SIGNAL LINES ON RS-232C/V.24 INTERFACE OR CROSSPATCH LINES FROM DCE TO DTE INTERFACE; POWERED BYSIX 9 VOLT ALKALINE BATTERIES, BATTERY LIFE EXCEEDS 50 OPERATING HOURS